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  2. Ball grid array - Wikipedia

    en.wikipedia.org/wiki/Ball_grid_array

    Cross-cut section of BGA mounted circuit. A ball grid array (BGA) is a type of surface-mount packaging (a chip carrier) used for integrated circuits. BGA packages are used to permanently mount devices such as microprocessors. A BGA can provide more interconnection pins than can be put on a dual in-line or flat package. The whole bottom surface ...

  3. Head-in-pillow defect - Wikipedia

    en.wikipedia.org/wiki/Head-in-pillow_defect

    For example, in the case of a ball grid array (BGA) package, the pre-deposited solder ball on the package and the solder paste applied to the circuit board may both melt, but the melted solder does not join. A cross-section through the failed joint shows a distinct boundary between the solder ball on the part and the solder paste on the circuit ...

  4. Dye-and-pry - Wikipedia

    en.wikipedia.org/wiki/Dye-and-Pry

    Dye-n-Pry is a useful failure analysis technique to detect cracking or open circuits in BGA solder joints. [2] This has some practical advantages over other destructive techniques, such as cross sectioning, as it can inspect a full ball grid array which may consist of hundreds of solder joints. Cross sectioning, on the other hand, may only be ...

  5. Flip chip - Wikipedia

    en.wikipedia.org/wiki/Flip_chip

    Flip chip, also known as controlled collapse chip connection or its abbreviation, C4, [1] is a method for interconnecting dies such as semiconductor devices, IC chips, integrated passive devices and microelectromechanical systems (MEMS), to external circuitry with solder bumps that have been deposited onto the chip pads.

  6. Toxic spill fears follow deadly Brazil bridge collapse

    www.aol.com/toxic-spill-fears-deadly-brazil...

    Lorries containing pesticides and sulphuric acid plunged into the Tocantins river in the north of the country.

  7. Pad cratering - Wikipedia

    en.wikipedia.org/wiki/Pad_cratering

    It is a useful test for all pad geometries and is sensitive to board design and materials. The ball pull test is specifically design for BGA components and has a large sensitivity to the solder alloy and joint formation. The ball shear test is also specified for BGA components and involves shearing the solder balls of the BGA.

  8. Toxic equivalency factor - Wikipedia

    en.wikipedia.org/wiki/Toxic_Equivalency_Factor

    Toxic equivalency factor (TEF) expresses the toxicity of dioxins, furans and PCBs in terms of the most toxic form of dioxin, 2,3,7,8-TCDD. [1] The toxicity of the individual congeners may vary by orders of magnitude .

  9. Embedded wafer level ball grid array - Wikipedia

    en.wikipedia.org/wiki/Embedded_Wafer_Level_Ball...

    Embedded wafer level ball grid array (eWLB) is a packaging technology for integrated circuits. The package interconnects are applied on an artificial wafer made of silicon chips and a casting compound.