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Bridging to VDD or Vss is equivalent to stuck at fault model. Traditionally bridged signals were modeled with logic AND or OR of signals. If one driver dominates the other driver in a bridging situation, the dominant driver forces the logic to the other one, in such case a dominant bridging fault is used.
Basic fault models in digital circuits include: Static faults, which give incorrect values at any speed and sensitized by performing only one operation: the stuck-at fault model. A signal, or gate output, is stuck at a 0 or 1 value, independent of the inputs to the circuit. the bridging fault model. Two signals are connected together when they ...
Bridging to VDD or Vss is equivalent to stuck at fault model. Traditionally both signals after bridging were modeled with logic AND or OR of both signals. If one driver dominates the other driver in a bridging situation, the dominant driver forces the logic to the other one, in such case a dominant bridging fault is used.
Various fault types may be applied to the diagnostic model. Commonly used fault types are: stuck-at faults, which simulates a node stuck high or low; stuck-open fault, which simulates a disconnected node; bridging faults, which simulate an unwanted connected between two nodes; transition-delay faults, which simulate slow signal switching on a node
A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to ...
Another advantage is that it may catch faults that are not found by conventional stuck-at fault test vectors. Iddq testing is somewhat more complex than just measuring the supply current. If a line is shorted to Vdd, for example, it will still draw no extra current if the gate driving the signal is attempting to set it to '1'.
2.0 Overview of Software Reliability Growth (Estimation) Models Software reliability growth (or estimation) models use failure data from testing to forecast the failure rate or MTBF into the future. The models depend on the assumptions about the fault rate during testing which can either be increasing, peaking, decreasing or some combination of ...
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