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Testing at the physical environmental conditions (shock, vibration, temperature, altitude, humidity, etc.) that simulate those encountered over the operational life of the component. Random vibration and temperature cycling have proven to be the most successful forms of ESS in terms of effective flaw precipitation.
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
A shock data logger or vibration data logger is a measurement instrument that is capable of autonomously recording shocks or vibrations over a defined period of time. Digital data is usually in the form of acceleration and time. The shock and vibration data can be retrieved (or transmitted), viewed and evaluated after it has been recorded.
IEC 60068 is an international standard for the environmental testing of electrotechnical products that is published by the International Electrotechnical Commission (IEC).. IEC 60068 is a collection of methods [1] for environmental testing of electronic equipment and products to assess their ability to perform under environmental conditions including extreme cold and dry heat.
An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.
A random vibration test suite may range anywhere from 30 seconds up to several hours. It is intended to synthesize the effect of, for example, a car driving over rough terrain or a rocket taking off. A synthesized shock pulse is a short duration high level vibration calculated as a sum of many half-sine waves covering a range of frequencies.
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