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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
Propagation of a ray through a layer. The transfer-matrix method is a method used in optics and acoustics to analyze the propagation of electromagnetic or acoustic waves through a stratified medium; a stack of thin films. [1] [2] This is, for example, relevant for the design of anti-reflective coatings and dielectric mirrors.
Diagram of Lambertian diffuse reflection. The black arrow shows incident radiance, and the red arrows show the reflected radiant intensity in each direction. When viewed from various angles, the reflected radiant intensity and the apparent area of the surface both vary with the cosine of the viewing angle, so the reflected radiance (intensity per unit area) is the same from all viewing angles.
The angle of incidence, in geometric optics, is the angle between a ray incident on a surface and the line perpendicular (at 90 degree angle) to the surface at the point of incidence, called the normal. The ray can be formed by any waves, such as optical, acoustic, microwave, and X-ray. In the figure below, the line representing a ray makes an ...
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...
[1] The law of reflection states that a reflected ray of light emerges from the reflecting surface at the same angle to the surface normal as the incident ray, but on the opposing side of the surface normal in the plane formed by the incident and reflected rays. This behavior was first described by Hero of Alexandria (AD c. 10–70). [2]
Grazing-incidence small-angle scattering (GISAS) a hybrid approach using small scattering (diffraction) angles with X-rays or neutrons. [5] X-ray reflectivity, yet another related technique, but here the intensity of the specular reflected beam is measured. [6] [7] [8]
Figure 1 – General mechanism of diffuse reflection by a solid surface (refraction phenomena not represented) Figure 2 – Diffuse reflection from an irregular surface. Diffuse reflection from solids is generally not due to surface roughness. A flat surface is indeed required to give specular reflection, but it does not prevent diffuse reflection.