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  2. CR-5000 - Wikipedia

    en.wikipedia.org/wiki/CR-5000

    CR-5000 is made to facilitate the design of complex and high-speed boards, with features aimed at addressing challenges such as signal integrity and electromagnetic compatibility. CR-5000 is the fourth-generation successor of CREATE1000, originally developed for the PDP-11 by Zukei-Gijutsu-Kenkyusho (Japanese for "Graphic Technology and ...

  3. Via (electronics) - Wikipedia

    en.wikipedia.org/wiki/Via_(electronics)

    PCB via current capacity chart showing 1 mil plating via current capacity & resistance versus diameter on a 1.6 mm PCB. In printed circuit board (PCB) design, a via consists of two pads in corresponding positions on different copper layers of the board, that are electrically connected by a hole through the board.

  4. KiCad - Wikipedia

    en.wikipedia.org/wiki/KiCad

    KiCad (/ ˈ k iː ˌ k æ d / KEE-kad [7]) is a free software suite for electronic design automation (EDA). It facilitates the design and simulation of electronic hardware for PCB manufacturing. It features an integrated environment for schematic capture, PCB layout, manufacturing file viewing, ngspice-provided SPICE simulation, and

  5. Proteus Design Suite - Wikipedia

    en.wikipedia.org/wiki/Proteus_Design_Suite

    Download as PDF; Printable version; ... Support for high speed design was added in 2017. [1] ... All PCB Design products include an autorouter and basic mixed mode ...

  6. Signal integrity - Wikipedia

    en.wikipedia.org/wiki/Signal_integrity

    Signal Integrity (SI) in PCB design refers to the quality of electrical signals as they travel through traces, vias, and components on a printed circuit board. Ensuring good signal integrity is critical for high-speed and high-frequency designs, as poor signal quality can lead to data errors, signal distortion, and system malfunction.

  7. Teardrop (electronics) - Wikipedia

    en.wikipedia.org/wiki/Teardrop_(electronics)

    For similar reasons, a technique called trace necking reduces (or necks down [7] [8] [9]) the width of a trace that approaches a narrower pad of a surface-mounted device or a through-hole with a diameter that is less than the width of the trace, or when the trace passes through bottlenecks (for example, between the pads of a component).

  8. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    In scan design, registers (flip-flops or latches) in the design are connected in one or more scan chains, which are used to gain access to internal nodes of the chip. Test patterns are shifted in via the scan chain(s), functional clock signals are pulsed to test the circuit during the "capture cycle(s)", and the results are then shifted out to ...

  9. CADSTAR - Wikipedia

    en.wikipedia.org/wiki/CADSTAR

    CADSTAR spans schematic capture, variant management, placement, automatic and high-speed routing, signal integrity, power integrity, EMC analysis, design rule checks and production of manufacturing data. Originally developed by U.K. PCB vendor Racal-Redac, CADSTAR has been part of the Zuken product portfolio since its acquisition in 1994. [1]

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