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Consider a quality characteristic with a target of 100.00 μm and upper and lower specification limits of 106.00 μm and 94.00 μm, respectively. If, after carefully monitoring the process for a while, it appears that the process is out of control and producing output unpredictably (as depicted in the run chart below), one can't meaningfully estimate its mean and standard deviation.
If the upper and lower specification limits of the process are USL and LSL, the target process mean is T, the estimated mean of the process is ^ and the estimated variability of the process (expressed as a standard deviation) is ^, then commonly accepted process capability indices include:
The process capability is a measurable property of a process to the specification, expressed as a process capability index (e.g., C pk or C pm) or as a process performance index (e.g., P pk or P pm).
In process improvement efforts, defects per million opportunities or DPMO (or nonconformities per million opportunities (NPMO)) is a measure of process performance.It is defined as
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