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Scanning probe lithography[1] (SPL) describes a set of nanolithographic methods to pattern material on the nanoscale using scanning probes. It is a direct-write, mask-less approach which bypasses the diffraction limit and can reach resolutions below 10 nm. [2] It is considered an alternative lithographic technology often used in academic and ...
Dip pen nanolithography (DPN) is a scanning probe lithography technique where an atomic force microscope (AFM) tip is used to directly create patterns on a substrate. [1] It can be done on a range of substances with a variety of inks. A common example of this technique is exemplified by the use of alkane thiolates to imprint onto a gold surface ...
Technology portal. v. t. e. Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling ...
Thermal polymer decomposition. Thermal scanning probe lithography (t-SPL) is a form of scanning probe lithography [1] (SPL) whereby material is structured on the nanoscale using scanning probes, primarily through the application of thermal energy. Related fields are thermo-mechanical SPL (see also Millipede memory), thermochemical SPL[2][3] (or ...
Scanning voltage microscopy ( SVM ), sometimes also called nanopotentiometry, is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or optoelectronic sample. By connecting the probe to a high- impedance ...
Scanning ion-conductance microscopy (SICM) is a scanning probe microscopy technique that uses an electrode as the probe tip. [1] SICM allows for the determination of the surface topography of micrometer and even nanometer-range [2] structures in aqueous media conducting electrolytes. The samples can be hard or soft, are generally non-conducting ...
A new type of lens using multiple scattering of light allowed to improve the resolution to about 100 nm. Several new microscopy techniques with a sub-nanometer resolution have been developed in the last several decades, such as electron microscopy (SEM and TEM) and scanning probe microscopy (NSOM, STM and AFM). SPM differs from other techniques ...
A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures. The probe tip is mounted on the end of a cantilever and can be as sharp as a single atom. In microscopy, probe tip geometry (length, width, shape, aspect ratio, and tip apex radius) and ...