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The annualized loss expectancy is the product of the annual rate of occurrence (ARO) and the single loss expectancy. ALE = ARO * SLE For an annual rate of occurrence of 1, the annualized loss expectancy is 1 * $25,000, or $25,000. For an ARO of 3, the equation is: ALE = 3 * $25,000. Therefore: ALE = $75,000
Churn rate (also known as attrition rate, turnover, customer turnover, or customer defection) [1] is a measure of the proportion of individuals or items moving out of a group over a specific period. It is one of two primary factors that determine the steady-state level of customers a business will support.
Compound annual growth rate (CAGR) is a business, economics and investing term representing the mean annualized growth rate for compounding values over a given time period. [1] [2] CAGR smoothes the effect of volatility of periodic values that can render arithmetic means less meaningful. It is particularly useful to compare growth rates of ...
Many organizations maintain internal databases of failure information on the devices or systems that they produce, which can be used to calculate failure rates for those devices or systems. For new devices or systems, the historical data for similar devices or systems can serve as a useful estimate. Government and commercial failure rate data
Trailing twelve months (TTM) is a measurement of a company's financial performance (income and expenses) used in finance.It is measured by using the income statements from a company's reports (such as interim, quarterly or annual reports), to calculate the income for the twelve-month period immediately prior to the date of the report.
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The time-weighted return (TWR) [1] [2] is a method of calculating investment return, where returns over sub-periods are compounded together, with each sub-period weighted according to its duration. The time-weighted method differs from other methods of calculating investment return, in the particular way it compensates for external flows.
Annualized failure rate (AFR) gives the estimated probability that a device or component will fail during a full year of use. It is a relation between the mean time between failure ( MTBF ) and the hours that a number of devices are run per year.