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Nonvolatile BIOS memory refers to a small memory on PC motherboards that is used to store BIOS settings. It is traditionally called CMOS RAM because it uses a volatile, low-power complementary metal–oxide–semiconductor (CMOS) SRAM (such as the Motorola MC146818 [1] or similar) powered by a small battery when system and standby power is off. [2]
CMOS inverter (a NOT logic gate). Complementary metal–oxide–semiconductor (CMOS, / ˈ s iː m ɒ s /, also US: /-ɔː s / [1]) is a type of metal–oxide–semiconductor field-effect transistor (MOSFET) fabrication process that uses complementary and symmetrical pairs of p-type and n-type MOSFETs for logic functions. [2]
Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state (when the circuit is not switching and inputs are held at static values). The current consumed in the state is commonly called Iddq for Idd (quiescent) and hence the name.
A bright dot defect or hot pixel is a group of three sub-pixels (one pixel) all of whose transistors are "off" for TN panels or stuck "on" for MVA and PVA panels. [2] This allows all light to pass through to the RGB layer, creating a bright pixel that is always on.
According to Toshiba, the name "flash" was suggested by Masuoka's colleague, Shōji Ariizumi, because the erasure process of the memory contents reminded him of the flash of a camera. [27] Masuoka and colleagues presented the invention of NOR flash in 1984, [ 28 ] [ 29 ] and then NAND flash at the IEEE 1987 International Electron Devices ...
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His contributions include the first digital-pixel CMOS image sensor in 1994; the first scientific linear CMOS image sensor with single-electron RMS read noise in 2003; the first multi-megapixel scientific area CMOS image sensor with simultaneous high dynamic range (86 dB), fast readout (100 frames/second) and ultra-low read noise (1.2e- RMS ...