Ads
related to: power probe circuit tester- Freedom Operating Lease
Low Monthly Payments and the
Option to Buy at the End of Term.
- Featured Test Equipment
See the latest featured test equip
available to rent from TRS-Rentelco
- Browse by Category
Generators, Cable Testers & More.
Find the Test Equipment You Need!
- TCO Calculator
Calculate the Total Cost or Renting
vs Buying With our TCO Calculator!
- Freedom Operating Lease
ebay.com has been visited by 1M+ users in the past month
supplyhouse.com has been visited by 100K+ users in the past month
Search results
Results from the WOW.Com Content Network
Typical passive oscilloscope probe being used to test an integrated circuit. A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.
Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
Advanced Tester Resource Enhancement (ATRE) [5] is a powerful means of increasing the number of DUTs that can be tested by a probe card in parallel (or in one touchdown during which probe card needles remain in contact with the wafer DUTs). ATRE allows the sharing of tester resources among DUTs using active components, which have the ability to ...
Test bench; Test light; Test loop translator; Test probe; Time base generator; Time-domain reflectometer; Total harmonic distortion analyzer; Transformer ratio arm bridge; Transistor tester; Tube tester; Two-tone testing
Ads
related to: power probe circuit testerebay.com has been visited by 1M+ users in the past month
supplyhouse.com has been visited by 100K+ users in the past month