enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern. It is different from X-ray crystallography which exploits X-ray diffraction to determine the arrangement of atoms in materials, and also has other components such as ways to map from experimental diffraction measurements to the positions of atoms.

  3. Wyckoff positions - Wikipedia

    en.wikipedia.org/wiki/Wyckoff_positions

    The Wyckoff positions are named after Ralph Wyckoff, an American X-ray crystallographer who authored several books in the field.His 1922 book, The Analytical Expression of the Results of the Theory of Space Groups, [3] contained tables with the positional coordinates, both general and special, permitted by the symmetry elements.

  4. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    A powder X-ray diffractometer in motion. X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions.

  5. Greninger chart - Wikipedia

    en.wikipedia.org/wiki/Greninger_chart

    The Greninger chart is a simple trigonometric tool to determine g and d for a fixed sample-to-film distance. (If one uses a 2-d detector the problem of determining g and d could be solved mathematically using the equations which generate the Greninger chart) A new chart must be generated for different sample to detector distances.

  6. X-ray crystal truncation rod - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystal_truncation_rod

    To obtain high-quality data in X-ray CTR measurements, it is desirable that the detected intensity be on the order of at least [citation needed]. To achieve this level of output, the X-ray source must typically be a synchrotron source. More traditional, inexpensive sources such as rotating anode sources provide 2-3 orders of magnitude less X ...

  7. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    The summation extends to all data points. Considering the peak shape functions and accounting for the overlapping of Bragg peaks because of the one-dimensionality of XRD data, the expanded form of the above equation for the case of a single phase measured with a single wavelength becomes:

  8. X-ray diffraction computed tomography - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction_computed...

    X-ray diffraction computed tomography, often abbreviated as XRD-CT, typically refers to the technique invented by Harding et al. [1] which assumes that the acquired data are powder diffraction data. For this reason, it has also been mentioned as powder diffraction computed tomography [ 7 ] and diffraction scattering computed tomography (DSCT ...

  9. X-ray absorption spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_absorption_spectroscopy

    XAS data is obtained by tuning the photon energy, [3] using a crystalline monochromator, to a range where core electrons can be excited (0.1-100 keV). The edges are, in part, named by which core electron is excited: the principal quantum numbers n = 1, 2, and 3, correspond to the K-, L-, and M-edges, respectively. [ 4 ]

  1. Related searches how to interpret xrd graph results table of data is called the current ratio

    xrd definitionx ray diffraction wiki
    x ray crystallography chartx ray crystallography wiki