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Structural equation modeling (SEM) is a diverse set of methods used by scientists for both observational and experimental research. SEM is used mostly in the social and behavioral science fields, but it is also used in epidemiology, [2] business, [3] and other fields. A common definition of SEM is, "...a class of methodologies that seeks to ...
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
The data format is defined by a standard published by the Video Electronics Standards Association (VESA). The EDID data structure includes manufacturer name and serial number, product type, phosphor or filter type (as chromaticity data), timings supported by the display, display size, luminance data and (for digital displays only) pixel mapping ...
These signals can be obtained simultaneously, allowing direct correlation of images and spectroscopic data. A typical STEM is a conventional transmission electron microscope equipped with additional scanning coils , detectors, and necessary circuitry, which allows it to switch between operating as a STEM, or a CTEM; however, dedicated STEMs are ...
The variation of electron collection fraction R within anode radius r vs. r/d, for fixed values of anode bias V, at constant product of (pressure·distance) p·d = 1 Pa·m, is given by the accompanying characteristic curves of efficiency of the GDD. All of the secondary electrons are detected if the parameters of this device are properly designed.
Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In the microscope an ...
Only SEM-like imaging using secondary electrons is possible, and even that imaging is restricted to short observations due to sample damaging by the Ga + beam. The use of a dual beam instrument, that combines a FIB and an SEM in one, circumvents this limitation. The advantages of IBID are: Much higher deposition rate; Higher purity
The use of diffraction patterns as a function of position dates back to the earliest days of STEM, for instance the early review of John M. Cowley and John C. H. Spence in 1978 [2] or the analysis in 1983 by Laurence D. Marks and David J. Smith of the orientation of different crystalline segments in nanoparticles. [3]