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The Wyckoff positions are named after Ralph Wyckoff, an American X-ray crystallographer who authored several books in the field.His 1922 book, The Analytical Expression of the Results of the Theory of Space Groups, [3] contained tables with the positional coordinates, both general and special, permitted by the symmetry elements.
Modern work involves a number of steps all of which are important. The preliminary steps include preparing good quality samples, careful recording of the diffracted intensities, and processing of the data to remove artifacts. A variety of different methods are then used to obtain an estimate of the atomic structure, generically called direct ...
The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern. It is different from X-ray crystallography which exploits X-ray diffraction to determine the arrangement of atoms in materials, and also has other components such as ways to map from experimental diffraction measurements to the positions of atoms.
Crystallographic data are primarily extracted from published scientific articles and supplementary material. Newer versions of crystallographic databases are built on the relational database model, which enables efficient cross-referencing of tables. Cross-referencing serves to derive additional data or enhance the search capacity of the database.
The distance between these planes is called the d-spacing. The intensity of the d-space pattern is directly proportional to the number of electrons (atoms) in the imaginary planes. Every crystalline solid has a unique pattern of d-spacings (known as the powder pattern), which is a fingerprint for that solid.
The most common powder X-ray diffraction (XRD) refinement technique used today is based on the method proposed in the 1960s by Hugo Rietveld. [2] The Rietveld method fits a calculated profile (including all structural and instrumental parameters) to experimental data.
Mass attenuation coefficients of selected elements for X-ray photons with energies up to 250 keV. The mass attenuation coefficient, or mass narrow beam attenuation coefficient of a material is the attenuation coefficient normalized by the density of the material; that is, the attenuation per unit mass (rather than per unit of distance).
This results in an absorption edge. Every element has a set of unique absorption edges corresponding to different binding energies of its electrons, giving XAS element selectivity. XAS spectra are most often collected at synchrotrons because the high intensity of synchrotron X-ray sources allows the concentration of the absorbing element to ...