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  2. Probe tip - Wikipedia

    en.wikipedia.org/wiki/Probe_Tip

    A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures. The probe tip is mounted on the end of a cantilever and can be as sharp as a single atom .

  3. Clamp holder - Wikipedia

    en.wikipedia.org/wiki/Clamp_holder

    Clamp holders can secure laboratory equipment at specific angles, diameters, and weights, as required. [3] Clamp holders are often used to hold the attached apparatus over a work surface. There are several different types of holders, such as swivel holders and all-position holders, that allow adjustments for different angles and planes. In some ...

  4. The Home Depot Pro - Wikipedia

    en.wikipedia.org/wiki/The_Home_Depot_Pro

    The acquisition of Interline Brands allows The Home Depot access to expand its business to the multi-family sector, hospitality, and industrial area. Craig Menear, CEO of The Home Depot, says that the purchase gives The Home Depot more opportunity to expand in the maintenance, repair, and operations sector that was previously not successful.

  5. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    An AFM probe has a sharp tip on the free-swinging end of a cantilever that protrudes from a holder. [29] The dimensions of the cantilever are in the scale of micrometers. The radius of the tip is usually on the scale of a few nanometers to a few tens of nanometers.

  6. Glossary of firefighting equipment - Wikipedia

    en.wikipedia.org/wiki/Glossary_of_firefighting...

    Short hook with a pointed tip is a pike pole; longer hook on a San Francisco hook; two offset hooks on either side of tip is a universal hook; long p-shaped hook is a Boston rake for pulling plaster and lath; short hook with claw on opposite side of tip is either a gypsum hook or the narrower ceiling hook; pike pole with a short handle is a ...

  7. Mechanical probe station - Wikipedia

    en.wikipedia.org/wiki/Mechanical_probe_station

    Probe stations have evolved to better manage both wafer level and device testing. An example of this is the VERSA probe system by Micromanipulator. Systems like the VERSA can visualize and probe all size wafers from 50mm, 100mm, 150mm, 200mm, 300mm, and even 450mm. systems like the VERSA can also manage testing individual chips or die as well ...

  8. Test probe - Wikipedia

    en.wikipedia.org/wiki/Test_probe

    The matched impedances provide better high-frequency performance than an unmatched passive probe can achieve, but at the expense of the low 500-ohm load offered by the probe tip to the DUT. Parasitic capacitance at the probe tip is very low so, for very high-frequency signals, the Z 0 probe can offer lower loading than any hi-Z probe and even ...

  9. Home Depot - Wikipedia

    en.wikipedia.org/wiki/Home_Depot

    This is an accepted version of this page This is the latest accepted revision, reviewed on 28 January 2025. American multinational home improvement supplies retailing company The Home Depot, Inc. An aerial view of a Home Depot in Onalaska, Wisconsin Company type Public Traded as NYSE: HD DJIA component S&P 100 component S&P 500 component Industry Retail (home improvement) Founded February 6 ...

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