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  2. File:Standard x-ray diffraction patterns (IA jresv46n4p318).pdf

    en.wikipedia.org/wiki/File:Standard_x-ray...

    What links here; Upload file; Special pages; Printable version; Page information

  3. International Centre for Diffraction Data - Wikipedia

    en.wikipedia.org/wiki/International_Centre_for...

    Advances in X-ray Analysis—Technical articles on x-ray methods and analyses; Powder Diffraction Journal—quarterly journal published by the JCPDS-International Centre for Diffraction Data through the Cambridge University Press; Denver X-ray Conference—World's largest X-ray conference on the latest advancements in XRD and XRF; PPXRD-16 ...

  4. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.

  5. Crystallographic database - Wikipedia

    en.wikipedia.org/wiki/Crystallographic_database

    Reflection positions and intensities of known crystal phases, mostly from X-ray diffraction data, are stored, as d-I data pairs, in the Powder Diffraction File database. The list of d - I data pairs is highly characteristic of a crystal phase and, thus, suitable for the identification, also called ‘fingerprinting’, of crystal phases.

  6. Cambridge Structural Database - Wikipedia

    en.wikipedia.org/wiki/Cambridge_Structural_Database

    The primary file format for CSD structure deposition, adopted around 1991, is the "Crystallographic Information file" format, CIF. [16] The deposited CSD files can be downloaded in the CIF format. The validated and curated CSD files can be exported in a wide range of formats, including CIF, MOL, Mol2, PDB, SHELX and XMol, using tools in the CSD ...

  7. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    The most common powder X-ray diffraction (XRD) refinement technique used today is based on the method proposed in the 1960s by Hugo Rietveld. [2] The Rietveld method fits a calculated profile (including all structural and instrumental parameters) to experimental data.

  8. Three-dimensional X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/Three-dimensional_X-ray...

    Compared with destructive techniques, e.g. three-dimensional electron backscatter diffraction (3D EBSD), [5] with which the sample is serially sectioned and imaged, 3DXRD and similar X-ray nondestructive techniques have the following advantages: They require less sample preparation, thus limiting the introduction of new structures in the sample.

  9. XRD - Wikipedia

    en.wikipedia.org/wiki/XRD

    XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource