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2. In-circuit testing - Wikipedia

   en.wikipedia.org/wiki/In-circuit_testing

   While in-circuit test is a very powerful tool for testing PCBs, it has these limitations: Parallel components can often only be tested as one component if the components are of the same type (i.e. two resistors); though different components in parallel may be testable using a sequence of different tests - e.g. a DC voltage measurement versus a measurement of AC injection current at a node.

3. List of electrical and electronic measuring equipment

   en.wikipedia.org/wiki/List_of_electrical_and...

   Transistor tester: Tests transistors Tube tester: Tests vacuum tubes (triode, tetrode etc.) Wattmeter: Measures power in a circuit Vectorscope: Displays the phase of the colors in color TV Video signal generator: Generates video signal for testing purposes Voltmeter: Measures the potential difference between two points in a circuit. (Includes ...

4. Bed of nails tester - Wikipedia

   en.wikipedia.org/wiki/Bed_of_nails_tester

   Spring loaded pins are a component of the bed of nails tester. A bed of nails tester is a traditional electronic test fixture used for in-circuit testing.It has pins inserted into holes in an epoxy phenolic glass cloth laminated sheet (G-10) which are aligned using tooling pins to make contact with test points on a printed circuit board and are also connected to a measuring unit by wires.

5. Flying probe - Wikipedia

   en.wikipedia.org/wiki/Flying_probe

   One limitation in flying probe test methods is the speed at which measurements can be taken; the probes must be moved to each new test site on the board, and then a measurement must be completed. Bed-of-nails testers touch each test point simultaneously and electronic switching of instruments between test pins is more rapid than movement of probes.

6. In-circuit emulation - Wikipedia

   en.wikipedia.org/wiki/In-circuit_emulation

   On-chip debugging is an alternative to in-circuit emulation. It uses a different approach to address a similar goal. On-chip debugging, often loosely termed as Joint Test Action Group (JTAG), uses the provision of an additional debugging interface to the live hardware, in the production system. It provides the same features as in-circuit ...

7. Multimeter - Wikipedia

   en.wikipedia.org/wiki/Multimeter

   A multimeter can use many different test probes to connect to the circuit or device under test. Crocodile clips, retractable hook clips, and pointed probes are the three most common types. Tweezer probes are used for closely spaced test points, as for instance surface-mount devices. The connectors are attached to flexible, well insulated leads ...