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  2. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.

  3. List of free electronics circuit simulators - Wikipedia

    en.wikipedia.org/wiki/List_of_free_electronics...

    List of free analog and digital electronic circuit simulators, available for Windows, macOS, Linux, and comparing against UC Berkeley SPICE.The following table is split into two groups based on whether it has a graphical visual interface or not.

  4. Bed of nails tester - Wikipedia

    en.wikipedia.org/wiki/Bed_of_nails_tester

    Spring loaded pins are a component of the bed of nails tester. A bed of nails tester is a traditional electronic test fixture used for in-circuit testing.It has pins inserted into holes in an epoxy phenolic glass cloth laminated sheet (G-10) which are aligned using tooling pins to make contact with test points on a printed circuit board and are also connected to a measuring unit by wires.

  5. Automated optical inspection - Wikipedia

    en.wikipedia.org/wiki/Automated_optical_inspection

    An Automated Optical Inspection device. Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew).

  6. In-circuit emulation - Wikipedia

    en.wikipedia.org/wiki/In-circuit_emulation

    On-chip debugging is an alternative to in-circuit emulation. It uses a different approach to address a similar goal. On-chip debugging, often loosely termed as Joint Test Action Group (JTAG), uses the provision of an additional debugging interface to the live hardware, in the production system. It provides the same features as in-circuit ...

  7. Flying probe - Wikipedia

    en.wikipedia.org/wiki/Flying_probe

    One limitation in flying probe test methods is the speed at which measurements can be taken; the probes must be moved to each new test site on the board, and then a measurement must be completed. Bed-of-nails testers touch each test point simultaneously and electronic switching of instruments between test pins is more rapid than movement of probes.

  8. Transistor tester - Wikipedia

    en.wikipedia.org/wiki/Transistor_tester

    The tester has all these features and can check solid-state devices in and out of circuit. Transistor h fe varies fairly widely with Ic, so measurements with the service type tester give readings that can differ quite a bit from the h fe in the transistor's real life application.

  9. Keysight - Wikipedia

    en.wikipedia.org/wiki/Keysight

    Keysight Technologies, Inc. is an American company that manufactures electronics test and measurement equipment and software. The name is a blend of key and insight. [2] [4] The company was formed as a spin-off of Agilent Technologies, which inherited and rebranded the test and measurement product lines developed and produced from the late 1960s to the turn of the millennium by Hewlett-Packard ...

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