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In electronics, a continuity test is the checking of an electric circuit to see if current flows (that it is in fact a complete circuit). A continuity test is performed by placing a small voltage (wired in series with an LED or noise-producing component such as a piezoelectric speaker) across the chosen path.
Isolation resistance measurements may be achieved using a high input impedance ohmmeter, digital multimeter (DMM) or current-limited Hipot test instrument. The selected equipment should not over-stress sensitive electronic components comprising the subsystem.
This led to the term "buzzing out a circuit" (which means to test for continuity) [3] Audible continuity buzzers or beepers are built into some models of multimeter, and the continuity setting is normally shared with the ohmmeter setting. A popular design has the tester combined with a standard flashlight.
Multimeter e.g., VOM (Volt-Ohm-Milliammeter) or DMM (Digital Multimeter) (Measures all of the above) LCR meter - inductance (L), capacitance (C) and resistance (R) meter (measure LCR values) The following are used for stimulus of the circuit under test: Power supplies; Signal generator; Digital pattern generator; Pulse generator
Analog multimeter Digital multimeter. A multimeter (also known as a volt-ohm-milliammeter, volt-ohmmeter or VOM) [1] is a measuring instrument that can measure multiple electrical properties. [2] [3] A typical multimeter can measure voltage, resistance, and current, [4] in which case can be used as a voltmeter, ohmmeter, and ammeter.
A breakout box is a piece of electrical test equipment used to support integration testing, expedite maintenance, and streamline the troubleshooting process at the system, subsystem, and component-level by simplifying the access to test signals. [1] Breakout boxes span a wide spectrum of functionality.
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Electronic components have a wide range of failure modes. These can be classified in various ways, such as by time or cause. Failures can be caused by excess temperature, excess current or voltage, ionizing radiation, mechanical shock, stress or impact, and many other causes. In semiconductor devices, problems in the device package may cause ...