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Like all compliance testing, it is important that the test equipment, including the test chamber or site and any software used, be properly calibrated and maintained. Typically, a given run of tests for a particular piece of equipment will require an EMC test plan and a follow-up test report. The full test program may require the production of ...
CISPR is the acronym of Comité International Spécial des Perturbations Radio, [1] or the International Special Committee for Radio Protection of IEC. CISPR Standards aim to the protection of radio reception in the range 9 kHz to 400 GHz from interference caused by operation of electrical or electronic appliances and systems in the electromagnetic environment.
A TEM or transverse electromagnetic cell is a type of test chamber used to perform electromagnetic compatibility (EMC) or electromagnetic interference (EMI) testing. It allows for the creation of far field electromagnetic fields in a small enclosed setting, or the detection of electromagnetic fields radiated within the chamber.
The publication describes requirements, levels and test methods to achieve immunity compliance of an electronic product. The purpose is to create a reproducible ground for product compliance and the standard defines: ranges, levels, test equipment, setups, procedures, calibrations, generator waveforms and general uncertainties.
It measures power quality of AC mains for different voltage levels as described in common EMC test standards. By definition, the AC harmonic is a multiple of the electrical quantity (voltage or current) at multiples of the fundamental frequency of the system, produced by the action of non-linear loads such as rectifier, lighting, or saturated ...
In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.
Test automation refers to the automation of the process to test a product through the use of machines. Depending on the product, the machines that we are referring to could mean a combination of Automatic Test Equipment (ATE), handler, interface board, and test program that drives the ATE, as with the case of the IC chip testing.
Note: This tables purpose is a quick overview. It does not contain the same level of detail as the official IEC 61000-4-4. The cause of electrical fast transients (EFT) come from an arc when mechanical contact is open due to a switching process. [5]