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2. Design for testing - Wikipedia

   en.wikipedia.org/wiki/Design_for_testing

   The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.

3. List of EDA companies - Wikipedia

   en.wikipedia.org/wiki/List_of_EDA_companies

   Design Architect-IC - Nanometer IC Design; Eldo - Nanometer IC Design: SPICE simulator; Eldo RF - Nanometer IC Design: SPICE simulator; Expedition - PCB design software; IP - intellectual property (now part of embedded systems division) ModelSim LE - Nanometer IC Design: digital design and simulation; Linux-based simulator with Dataflow Window ...

4. Test engineer - Wikipedia

   en.wikipedia.org/wiki/Test_engineer

   Depending on the product, the machines that we are referring to could mean a combination of Automatic Test Equipment (ATE), handler, interface board, and test program that drives the ATE, as with the case of the IC chip testing. Test automation is a big part of a test engineer's job. The whole intention of automating the test is as follows:

5. List of semiconductor fabrication plants - Wikipedia

   en.wikipedia.org/wiki/List_of_semiconductor...

   This is a list of semiconductor fabrication plants, factories where integrated circuits (ICs), also known as microchips, are manufactured.They are either operated by Integrated Device Manufacturers (IDMs) that design and manufacture ICs in-house and may also manufacture designs from design-only (fabless firms), or by pure play foundries that manufacture designs from fabless companies and do ...

6. List of integrated circuit manufacturers - Wikipedia

   en.wikipedia.org/wiki/List_of_integrated_circuit...

   The following is an incomplete list of notable integrated circuit (i.e. microchip) manufacturers. Some are in business, others are defunct and some are Fabless

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8. Scan chain - Wikipedia

   en.wikipedia.org/wiki/Scan_chain

   Scan chain is a technique used in design for testing. The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC. The basic structure of scan include the following set of signals in order to control and observe the scan mechanism. Scan_in and scan_out define the input and output of a scan chain.

9. Integrated circuit design - Wikipedia

   en.wikipedia.org/wiki/Integrated_circuit_design

   Digital design focuses on logical correctness, maximizing circuit density, and placing circuits so that clock and timing signals are routed efficiently. Analog IC design also has specializations in power IC design and RF IC design. Analog IC design is used in the design of op-amps, linear regulators, phase locked loops, oscillators and active ...