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The scanning helium microscope (SHeM) is a form of microscopy that uses low-energy (5–100 meV) neutral helium atoms to image the surface of a sample without any damage to the sample caused by the imaging process. Since helium is inert and neutral, it can be used to study delicate and insulating surfaces.
A scanning helium ion microscope (SHIM, HeIM or HIM) is an imaging technology based on a scanning helium ion beam. [2] Similar to other focused ion beam techniques, it allows to combine milling and cutting of samples with their observation at sub-nanometer resolution.
Scanning helium microscope may refer to: . Scanning helium microscopy; Scanning Helium Ion Microscope; Atomic nanoscope, which was proposed and discussed in the literature, but is not yet competitive with optical microscope, electron microscope, Scanning Helium Ion Microscope and various scanning probe microscopes
Field ion microscope image of the end of a sharp platinum needle. Each bright spot is a platinum atom. The field-ion microscope (FIM) was invented by Müller in 1951. [1] It is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip.
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This top-rated model heats up quickly and holds up to 2.5 pounds of fries or 14 wings at a time. Plus, it can be used to dehydrate food, proof bread and even bake desserts.
A Scanning SQUID Microscope is a sensitive near-field imaging system for the measurement of weak magnetic fields by moving a Superconducting Quantum Interference Device across an area. The microscope can map out buried current-carrying wires by measuring the magnetic fields produced by the currents, or can be used to image fields produced by ...