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The characterization technique optical microscopy showing the micron scale dendritic microstructure of a bronze alloy. Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science ...
The characterization of mechanical properties in polymers typically refers to a measure of the strength, elasticity, viscoelasticity, and anisotropy of a polymeric material. The mechanical properties of a polymer are strongly dependent upon the Van der Waals interactions of the polymer chains, and the ability of the chains to elongate and align ...
Characterization or characterisation is the representation of characters (persons, creatures, or other beings) in narrative and dramatic works. The term character development is sometimes used as a synonym .
A list of chemical analysis methods with acronyms. A. Atomic absorption spectroscopy (AAS) Atomic emission spectroscopy (AES) Atomic fluorescence spectroscopy (AFS) ...
Semiconductor characterization techniques are used to characterize a semiconductor material or device (p–n junction, Schottky diode, solar cell, etc.).Some examples of semiconductor properties that could be characterized include the depletion width, carrier concentration, carrier generation and recombination rates, carrier lifetimes, defect concentration, and trap states.
The characterization of nanoparticles is a branch of nanometrology that deals with the characterization, or measurement, of the physical and chemical properties of nanoparticles.,. [1] Nanoparticles measure less than 100 nanometers in at least one of their external dimensions, and are often engineered for their unique properties.
BET model of multilayer adsorption, that is, a random distribution of sites covered by one, two, three, etc., adsorbate molecules. The concept of the theory is an extension of the Langmuir theory, which is a theory for monolayer molecular adsorption, to multilayer adsorption with the following hypotheses:
Wafer bond characterization refers to the process of evaluating the quality and strength of a bond between two semiconductor wafers. The wafer bond characterization is based on different methods and tests. Considered a high importance of the wafer are the successful bonded wafers without flaws.