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M. von Ardenne's. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.
when the probability distribution of the value is known, it can be used to calculate an exact confidence interval; when the probability distribution is unknown, Chebyshev's or the Vysochanskiï–Petunin inequalities can be used to calculate a conservative confidence interval; and
Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is most commonly used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties. EBIC is similar to cathodoluminescence in ...
Structural equation modeling (SEM) is a diverse set of methods used by scientists doing both observational and experimental research. SEM is used mostly in the social and behavioral sciences but it is also used in epidemiology, [2] business, [3] and other fields. A definition of SEM is difficult without reference to technical language, but a ...
Search engine marketing (SEM) is a form of Internet marketing that involves the promotion of websites by increasing their visibility in search engine results pages (SERPs) primarily through paid advertising. [1] SEM may incorporate search engine optimization (SEO), which adjusts or rewrites website content and site architecture to achieve a ...
Piece of a crystallized polystyrene latex, SE image with ElectroScan 2020 ESEM. The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber.
Degrees of freedom (statistics) In statistics, the number of degrees of freedom is the number of values in the final calculation of a statistic that are free to vary. [1] Estimates of statistical parameters can be based upon different amounts of information or data. The number of independent pieces of information that go into the estimate of a ...
An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron microscope: the sample is bombarded with an electron beam ...