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In scientific writing, IMRAD or IMRaD (/ ˈ ɪ m r æ d /) (Introduction, Methods, Results, and Discussion) [1] is a common organizational structure for the format of a document. IMRaD is the most prominent norm for the structure of a scientific journal article of the original research type.
Compared with destructive techniques, e.g. three-dimensional electron backscatter diffraction (3D EBSD), [5] with which the sample is serially sectioned and imaged, 3DXRD and similar X-ray nondestructive techniques have the following advantages: They require less sample preparation, thus limiting the introduction of new structures in the sample.
The similar term "science writing" instead refers to writing about a scientific topic for a general audience; this could be by scientists and/or journalists, for example.) Scientific writing is a specialized form of technical writing, and a prominent genre of it involves reporting about scientific studies such as in articles for a scientific ...
A technical report (also scientific report) is a document that describes the process, progress, or results of technical or scientific research or the state of a technical or scientific research problem. [1] [2] It might also include recommendations and conclusions of the research.
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern.
In crystallography, the R-factor (sometimes called residual factor or reliability factor or the R-value or R Work) is a measure of the disagreement between the crystallographic model and the experimental X-ray diffraction data - lower the R value lower is the disagreement or better is the agreement.
Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions.
The sample of the desired surface crystallographic orientation is initially cut and prepared outside the vacuum chamber. The correct alignment of the crystal can be achieved with the help of X-ray diffraction methods such as Laue diffraction. [10] After being mounted in the UHV chamber the sample is cleaned and flattened.
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