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  2. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions.

  3. Characterization of nanoparticles - Wikipedia

    en.wikipedia.org/wiki/Characterization_of...

    The characterization of nanoparticles is a branch of nanometrology that deals with the characterization, or measurement, of the physical and chemical properties of nanoparticles.,. [1] Nanoparticles measure less than 100 nanometers in at least one of their external dimensions, and are often engineered for their unique properties. Nanoparticles ...

  4. Powder diffraction - Wikipedia

    en.wikipedia.org/wiki/Powder_diffraction

    X-ray powder diffraction of Y 2 Cu 2 O 5 and Rietveld refinement with two phases, showing 1% of yttrium oxide impurity (red tickers). Powder diffraction is a scientific technique using X-ray , neutron , or electron diffraction on powder or microcrystalline samples for structural characterization of materials. [ 2 ]

  5. Grazing incidence diffraction - Wikipedia

    en.wikipedia.org/wiki/Grazing_incidence_diffraction

    [1] [2] Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [3] X-ray standing waves, another X-ray variant where the intensity decay into a sample from diffraction is used to analyze chemistry. [4]

  6. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    While there are similarities between the diffraction of X-rays and electrons, as can be found in the book by John M. Cowley, [23] the approach is different as it is based upon the original approach of Hans Bethe [31] and solving Schrödinger equation for relativistic electrons, rather than a kinematical or Bragg's law approach. Information ...

  7. International Centre for Diffraction Data - Wikipedia

    en.wikipedia.org/wiki/International_Centre_for...

    It also publishes the journals Advances in X-ray Analysis and Powder Diffraction. In 2019, Materials Data, also known as MDI, merged with ICDD. Materials Data creates JADE software used to collect, analyze, and simulate XRD data and solve issues in an array of materials science projects.

  8. Small-angle X-ray scattering - Wikipedia

    en.wikipedia.org/wiki/Small-angle_X-ray_scattering

    Small-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes, characteristic distances of partially ordered materials, and much more. [1]

  9. X-ray crystallography - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystallography

    A powder X-ray diffractometer in motion. X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions.