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When Wilhelm Röntgen discovered X-rays in 1895 [1] physicists were uncertain of the nature of X-rays, but suspected that they were waves of electromagnetic radiation.The Maxwell theory of electromagnetic radiation was well accepted, and experiments by Charles Glover Barkla showed that X-rays exhibited phenomena associated with electromagnetic waves, including transverse polarization and ...
The distance between two bonded atoms is a sensitive measure of the bond strength and its bond order; thus, X-ray crystallographic studies have led to the discovery of even more exotic types of bonding in inorganic chemistry, such as metal-metal double bonds, [63] [64] [65] metal-metal quadruple bonds, [66] [67] [68] and three-center, two ...
Small-angle X-ray scattering (SAXS) probes structure in the nanometer to micrometer range by measuring scattering intensity at scattering angles 2θ close to 0°. X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films.
This is a list of analysis methods used in materials science. Analysis methods are listed by their acronym, if one exists. Analysis methods are listed by their acronym, if one exists. Contents:
In other words, it is a measure of how well the refined structure predicts the observed data. [1] The value is also sometimes called the discrepancy index, as it mathematically describes the difference between the experimental observations and the ideal calculated values. [2] It is defined by the following equation:
The result is that the crystallinity will never reach 100%. Powder XRD can be used to determine the crystallinity by comparing the integrated intensity of the background pattern to that of the sharp peaks. Values obtained from powder XRD are typically comparable but not quite identical to those obtained from other methods such as DSC.
It cannot measure the valence state of the element, for example Fe 2+ vs Fe 3+. [ 4 ] In certain elements, the K α line might overlap the K β of another element and hence if the first element is present, the second element cannot be reliably detected (for example V K α overlaps Ti K β ) [ 4 ]
In X-ray crystallography, wide-angle X-ray scattering (WAXS) or wide-angle X-ray diffraction (WAXD) is the analysis of Bragg peaks scattered to wide angles, which (by Bragg's law) are caused by sub-nanometer-sized structures. [1]