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Image of pollen grains taken on a SEM shows the characteristic depth of field of SEM micrographs M. von Ardenne's first SEM SEM with opened sample chamber Analog type SEM. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.
An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a detector such as a scintillator attached to a charge-coupled device or a direct electron detector.
A sample is imaged in a TEM as it is tilted to different angles, resulting in a "tilt-series" of 2D images (top). This tilt-series is then computationally reconstructed into a 3D "tomogram" (bottom). Cryogenic electron tomography ( cryoET ) is an imaging technique used to reconstruct high-resolution (~1–4 nm) three-dimensional volumes of ...
[1] [2] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2-bonded carbon (e.g., graphene, C nanotubes). While this term is often also used to refer to high resolution scanning transmission electron microscopy, mostly in high angle annular dark field mode, this ...
If the images are interpreted correctly, they can be used to identify crystal structures, determine their orientations, measure crystal characteristics, examine crystal defects or material textures. The course of analysis depends on whether the diffractogram depicts ring or spot diffraction pattern and on the quantity to be determined.
Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera .
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The red object in the lower left is a scale bar indicating relative size. Approximately 10× micrograph of a doubled die on a coin, where the date was punched twice in the die used to strike the coin. A micrograph is an image, captured photographically or digitally, taken through a microscope or similar device to show a magnified image of