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  2. Failure modes, effects, and diagnostic analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_Modes,_Effects...

    Given a component database calibrated with field failure data that is reasonably accurate, [1] the method can predict device level failure rate per failure mode, useful life, automatic diagnostic effectiveness, and latent fault test effectiveness for a given application.

  3. Worst-case circuit analysis - Wikipedia

    en.wikipedia.org/wiki/Worst-case_circuit_analysis

    The circuit's EVA and RSS results are determined for beginning-of-life and end-of-life states. These results are used to calculate part stresses and are applied to other analysis. In order for the WCCA to be useful throughout the product’s life cycle, it is extremely important that the analysis be documented in a clear and concise format.

  4. Structured analysis - Wikipedia

    en.wikipedia.org/wiki/Structured_analysis

    A configuration system structure chart. [21] A structure chart (SC) is a chart that shows the breakdown of the configuration system to the lowest manageable levels. [21] This chart is used in structured programming to arrange the program modules in a tree structure. Each module is represented by a box which contains the name of the modules.

  5. Failure rate - Wikipedia

    en.wikipedia.org/wiki/Failure_rate

    Government and commercial failure rate data Handbooks of failure rate data for various components are available from government and commercial sources. MIL-HDBK-217F, Reliability Prediction of Electronic Equipment, is a military standard that provides failure rate data for many military electronic components. Several failure rate data sources ...

  6. High-temperature operating life - Wikipedia

    en.wikipedia.org/.../High-temperature_operating_life

    High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.

  7. Bathtub curve - Wikipedia

    en.wikipedia.org/wiki/Bathtub_curve

    In the later life of the product, the failure rate increases due to wearout. Many electronic consumer product life cycles follow the bathtub curve. [ 1 ] It is difficult to know where a product is along the bathtub curve, or even if the bathtub curve is applicable to a certain product without large amounts of products in use and associated ...

  8. Technical data management system - Wikipedia

    en.wikipedia.org/wiki/Technical_data_management...

    After data acquisition, data is sorted out, whilst useful data is archived, unwanted data is disposed. When managing and archiving data, the features below of the data are considered. [5] Names, labels, values and descriptions for variables and records. (In the case of TDMS, one example is names of equipments on an equipment datasheet)

  9. Single-line diagram - Wikipedia

    en.wikipedia.org/wiki/Single-line_diagram

    A typical one-line diagram with annotated power flows. Red boxes represent circuit breakers, grey lines represent three-phase bus and interconnecting conductors, the orange circle represents an electric generator, the green spiral is an inductor, and the three overlapping blue circles represent a double-wound transformer with a tertiary winding.