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Given a component database calibrated with field failure data that is reasonably accurate, [1] the method can predict device level failure rate per failure mode, useful life, automatic diagnostic effectiveness, and latent fault test effectiveness for a given application.
The term power system control describes actions taken in response to unplanned disturbances (e.g., changes in demand or equipment failures) in order to provide reliable electric supply of acceptable quality. [3] The corresponding engineering branch is called Power System Operations and Control.
Government and commercial failure rate data Handbooks of failure rate data for various components are available from government and commercial sources. MIL-HDBK-217F, Reliability Prediction of Electronic Equipment, is a military standard that provides failure rate data for many military electronic components. Several failure rate data sources ...
In the later life of the product, the failure rate increases due to wearout. Many electronic consumer product life cycles follow the bathtub curve. [ 1 ] It is difficult to know where a product is along the bathtub curve, or even if the bathtub curve is applicable to a certain product without large amounts of products in use and associated ...
Applications such as aerospace systems, life support systems, telecommunications, railway signals, and computers use great numbers of individual electronic components. Analysis of the statistical properties of failures can give guidance in designs to establish a given level of reliability.
The U.S. Postal Service, which has lost more than $100 billion since 2007, reported a net loss of $9.5 billion for its fiscal year ending Sept. 30, $3 billion more than last year, largely due to a ...
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.
The end of the holiday weekend added two fresh examples of a historic shift on Wall Street: More CEOs than ever are heading for the exits. Over the past 24 hours, the leaders of chipmaker Intel ...