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To combat these variation effects, modern technology processes often supply SPICE or BSIM simulation models for all (or, at the least, TT, FS, and SF) process corners, which enables circuit designers to detect corner skew effects before the design is laid out, as well as post-layout (through parasitics extraction), before it is taped out.
Corner detection is an approach used within computer vision systems to extract certain kinds of features and infer the contents of an image. Corner detection is frequently used in motion detection, image registration, video tracking, image mosaicing, panorama stitching, 3D reconstruction and object recognition.
BEA has offered limited VM support for aspect-oriented extensions, but for extensions supported in all Java VM's would require agreement through Sun's Java Community Process (see also the java.lang.instrument package available since Java SE 5 — which is a common ground for JVM load-time instrumentation).
The Harris corner detector is a corner detection operator that is commonly used in computer vision algorithms to extract corners and infer features of an image. It was first introduced by Chris Harris and Mike Stephens in 1988 upon the improvement of Moravec's corner detector . [ 1 ]
Features from accelerated segment test (FAST) is a corner detection method, which could be used to extract feature points and later used to track and map objects in many computer vision tasks. The FAST corner detector was originally developed by Edward Rosten and Tom Drummond, and was published in 2006. [1]
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Electronics portal; This article is part of WikiProject Electronics, an attempt to provide a standard approach to writing articles about electronics on Wikipedia. If you would like to participate, you can choose to edit the article attached to this page, or visit the project page, where you can join the project and see a list of open tasks.
In semiconductor manufacturing, the "7 nm" process is a term for the MOSFET technology node following the "10 nm" node, defined by the International Roadmap for Devices and Systems (IRDS), which was preceded by the International Technology Roadmap for Semiconductors (ITRS).