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  2. Source measure unit - Wikipedia

    en.wikipedia.org/wiki/Source_measure_unit

    Such applications include I-V characterizing and testing semiconductors and other non-linear devices and materials, where sourcing voltage and current source span across both positive and negative values. To accomplish this, SMUs have four-quadrant outputs. [1] For characterization purposes SMUs are bench instruments similar to a curve tracer.

  3. Eddy-current testing - Wikipedia

    en.wikipedia.org/wiki/Eddy-current_testing

    Variations in the electrical conductivity and magnetic permeability of the test object, and the presence of defects causes a change in eddy current and a corresponding change in phase and amplitude that can be detected by measuring the impedance changes in the coil, which is a telltale sign of the presence of defects. [5]

  4. Alternating current field measurement - Wikipedia

    en.wikipedia.org/wiki/Alternating_Current_Field...

    Alternating current field measurement (ACFM) is an electromagnetic technique for non-destructive testing detection and sizing of surface breaking discontinuities. It was derived from the methods used in eddy-current testing and works on all metals, ferrous or non-ferrous. Since it doesn't require direct electrical contact with the surface it ...

  5. Current sensing - Wikipedia

    en.wikipedia.org/wiki/Current_sensing

    The design of the saturable inductor current sensor is similar to that of a closed-loop Hall-effect current sensor; the only difference is that this method uses the saturable inductor instead of the Hall-effect sensor in the air gap. Saturable inductor current sensor is based on the detection of an inductance change. The saturable inductor is ...

  6. Electromagnetic testing - Wikipedia

    en.wikipedia.org/wiki/Electromagnetic_testing

    If the test is set up properly, a defect inside the test object creates a measurable response. The term "electromagnetic testing" is often intended to mean simply eddy-current testing (ECT). However, with an expanding number of electromagnetic and magnetic test methods, "electromagnetic testing" is more often used to mean the whole class of ...

  7. Non-contact wafer testing - Wikipedia

    en.wikipedia.org/wiki/Non-contact_wafer_testing

    the probe will act as a circuit and affect the results of the test. For this reason, the tests performed at wafer sort cannot always be identical and as extensive as those performed at the final device test after packaging is complete [3] since the probe pads are typically on the perimeter of the IC, the IC can soon become pad-limited.

  8. Remote field testing - Wikipedia

    en.wikipedia.org/wiki/Remote_field_testing

    Although RFT works in nonferromagnetic materials such as copper and brass, its sister technology eddy-current testing is preferred. The basic RFT probe consists of an exciter coil (also known as a transmit or send coil) which sends a signal to the detector (or receive coil). The exciter coil is pumped with an AC current and emits a magnetic field.

  9. Insulation monitoring device - Wikipedia

    en.wikipedia.org/wiki/Insulation_monitoring_device

    An insulation monitoring device monitors the ungrounded system between an active phase conductor and earth. It is intended to give an alert (light and sound) or disconnect the power supply when the resistance between the two conductors drops below a set value, usually 50 k Ω (sample of IEC standard for medical applications).

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