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High precision test and measurement instrumentation June 20, 2014 Zygo Corporation [64] Non-contact optical metrology Aug. 5, 2014 AMPTEK, Inc. [65] X-ray detectors using x-ray fluorescence (XRF) Aug. 5, 2014 Luphos GmbH [66] Non-contact metrology technology May 8, 2015 Global Tubes [67] Small-diameter precision tubing July 7, 2015
Industrial CT scanners use X-rays to image an object from many angles, building up a 3D image to compare to a specification. [6] CT scans can be used to analyse the internal geometry of parts because the X-rays penetrate the object being scanned. Higher resolution CT scans can also check for cavities, cracks, and other undesirable features ...
A broadband “white light” source is used to illuminate the test and reference surfaces. A condenser lens collimates the light from the broadband light source. A beam splitter separates the light into reference and measurement beams. The reference beam is reflected by the reference mirror, while the measurement beam is reflected or scattered ...
Traditionally, without destructive testing, full metrology has only been performed on the exterior dimensions of components, such as with a coordinate-measuring machine (CMM) or with a vision system to map exterior surfaces. Internal inspection methods would require using a 2D X-ray of the component or the use of destructive testing.
As the output of 3D scanning processes, point clouds are used for many purposes, including to create 3D computer-aided design (CAD) or geographic information systems (GIS) models for manufactured parts, for metrology and quality inspection, and for a multitude of visualizing, animating, rendering, and mass customization applications.
Probing systems for microscale metrology applications are another emerging area. [6] [7] There are several commercially available coordinate measuring machines that have a microprobe integrated into the system, several specialty systems at government laboratories, and any number of university-built metrology platforms for microscale metrology ...
A measurement system analysis (MSA) is a thorough assessment of a measurement process, and typically includes a specially designed experiment that seeks to identify the components of variation in that measurement process. Just as processes that produce a product may vary, the process of obtaining measurements and data may also have variation ...
Optical comparators are used when physically touching the part is undesirable; components that consist of fragile or mailable materials require measurement using non-contact techniques. Instruments can now build 3D models of a part and its internal features using CT scanning [4] or X-ray imaging. [5]