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  2. Ametek - Wikipedia

    en.wikipedia.org/wiki/Ametek

    Power management systems and uninterruptible power supply (UPS) systems Jan 3, 2014 Teseq Group [62] Test and measurement instrumentation for electromagnetic compatibility (EMC) testing Feb 10, 2014 VTI Instruments [63] High precision test and measurement instrumentation June 20, 2014 Zygo Corporation [64] Non-contact optical metrology Aug. 5, 2014

  3. Measurement system analysis - Wikipedia

    en.wikipedia.org/wiki/Measurement_system_analysis

    A measurement system analysis (MSA) is a thorough assessment of a measurement process, and typically includes a specially designed experiment that seeks to identify the components of variation in that measurement process. Just as processes that produce a product may vary, the process of obtaining measurements and data may also have variation ...

  4. Test engineer - Wikipedia

    en.wikipedia.org/wiki/Test_engineer

    Test automation is a big part of a test engineer's job. The whole intention of automating the test is as follows: Enforce test steps to be followed within specifications and correct timing. Eliminate manual command and data inputs. Automate data gathering. Enforce test process flow.

  5. Computer-aided inspection - Wikipedia

    en.wikipedia.org/wiki/Computer-aided_inspection

    Industrial CT scanners use X-rays to image an object from many angles, building up a 3D image to compare to a specification. [6] CT scans can be used to analyse the internal geometry of parts because the X-rays penetrate the object being scanned. Higher resolution CT scans can also check for cavities, cracks, and other undesirable features ...

  6. Coordinate-measuring machine - Wikipedia

    en.wikipedia.org/wiki/Coordinate-measuring_machine

    Probing systems for microscale metrology applications are another emerging area. [6] [7] There are several commercially available coordinate measuring machines that have a microprobe integrated into the system, several specialty systems at government laboratories, and any number of university-built metrology platforms for microscale metrology ...

  7. Point cloud - Wikipedia

    en.wikipedia.org/wiki/Point_cloud

    As the output of 3D scanning processes, point clouds are used for many purposes, including to create 3D computer-aided design (CAD) or geographic information systems (GIS) models for manufactured parts, for metrology and quality inspection, and for a multitude of visualizing, animating, rendering, and mass customization applications.

  8. Structured-light 3D scanner - Wikipedia

    en.wikipedia.org/wiki/Structured-light_3D_scanner

    A structured-light 3D scanner is a device used to capture the three-dimensional shape of an object by projecting light patterns—such as grids or stripes, onto its surface. [1] The deformation of these patterns is recorded by cameras and processed using specialized algorithms to generate a detailed 3D model .

  9. Automated optical inspection - Wikipedia

    en.wikipedia.org/wiki/Automated_optical_inspection

    An Automated Optical Inspection device. Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew).