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Mass attenuation coefficients of selected elements for X-ray photons with energies up to 250 keV. The mass attenuation coefficient, or mass narrow beam attenuation coefficient of a material is the attenuation coefficient normalized by the density of the material; that is, the attenuation per unit mass (rather than per unit of distance).
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
X-rays or gamma rays, where it is denoted μ and measured in cm −1; neutrons and nuclear reactors, where it is called macroscopic cross section (although actually it is not a section dimensionally speaking), denoted Σ and measured in m −1; ultrasound attenuation, where it is denoted α and measured in dB⋅cm −1 ⋅MHz −1; [4] [5]
XPS physics - the photoelectric effect.. Because the energy of an X-ray with particular wavelength is known (for Al K α X-rays, E photon = 1486.7 eV), and because the emitted electrons' kinetic energies are measured, the electron binding energy of each of the emitted electrons can be determined by using the photoelectric effect equation,
These X-rays are emitted in all directions (isotropically), and so they may not all escape the sample. The likelihood of an X-ray escaping the specimen, and thus being available to detect and measure, depends on the energy of the X-ray and the composition, amount, and density of material it has to pass through to reach the detector.
The units of the structure-factor amplitude depend on the incident radiation. For X-ray crystallography they are multiples of the unit of scattering by a single electron (2.82 m); for neutron scattering by atomic nuclei the unit of scattering length of m is commonly used.
For X-ray scattering, () in the above equation is the electron charge density about the nucleus, and the form factor the Fourier transform of this quantity. The assumption of a spherical distribution is usually good enough for X-ray crystallography .
The scattering of X-rays can also be described in terms of scattering cross sections, in which case the square ångström is a convenient unit: 1 Å 2 = 10 −20 m 2 = 10 000 pm 2 = 10 8 b. The sum of the scattering, photoelectric, and pair-production cross-sections (in barns) is charted as the "atomic attenuation coefficient" (narrow-beam), in ...