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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
Download QR code; Print/export ... Ray tracing is a technique that can generate near photo-realistic computer images. A wide range of free software and commercial ...
X-ray reflectometry: is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. Propagation of electric pulses and reflection at discontinuities in cables is used in time domain reflectometry (TDR) to detect and localize defects in electric wiring.
motofit is a program for analysing neutron and X-ray reflectometry data. OpenFilters is a program for designing optical filters. Py_matrix is an open source Python code that implements the transfer-matrix method for multilayers with arbitrary dielectric tensors. It was especially created for plasmonic and magnetoplasmonic calculations.
X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
DXR starts by sending out a ray from each pixel on a given plane and calculates which objects on the plane are hit by the ray first. Next, the DXR algorithm estimates the amount of light where the ray intersects the object and attaches that calculation to the object. Objects can have different properties that will absorb or reflect light at ...
An X-ray spectrograph consists of a high voltage power supply (50 kV or 100 kV), a broad band X-ray tube, usually with a tungsten anode and a beryllium window, a specimen holder, an analyzing crystal, a goniometer, and an X-ray detector device. These are arranged as shown in Fig. 1.
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...