enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    Electronic components have a wide range of failure modes. These can be classified in various ways, such as by time or cause. Failures can be caused by excess temperature, excess current or voltage, ionizing radiation, mechanical shock, stress or impact, and many other causes. In semiconductor devices, problems in the device package may cause ...

  3. Moisture sensitivity level - Wikipedia

    en.wikipedia.org/wiki/Moisture_sensitivity_level

    Moisture sensitivity level (MSL) is a rating that shows a device's susceptibility to damage due to absorbed moisture when subjected to reflow soldering as defined in J-STD-020. It relates to the packaging and handling precautions for some semiconductors. The MSL is an electronic standard for the time period in which a moisture sensitive device ...

  4. Highly accelerated life test - Wikipedia

    en.wikipedia.org/wiki/Highly_accelerated_life_test

    Highly accelerated life test. A highly accelerated life test (HALT) is a stress testing methodology for enhancing product reliability in which prototypes are stressed to a much higher degree than expected from actual use in order to identify weaknesses in the design or manufacture of the product. [1] Manufacturing and research and development ...

  5. DO-160 - Wikipedia

    en.wikipedia.org/wiki/DO-160

    Aviation. Website. rtca.org. DO-160, Environmental Conditions and Test Procedures for Airborne Equipment is a standard for the environmental testing of avionics hardware. It is published by the Radio Technical Commission for Aeronautics (RTCA) and supersedes DO-138.

  6. High-temperature operating life - Wikipedia

    en.wikipedia.org/wiki/High-temperature_operating...

    High-temperature operating life. High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested ...

  7. Electrostatic discharge - Wikipedia

    en.wikipedia.org/wiki/Electrostatic_discharge

    Electrostatic discharge (ESD) is a sudden and momentary flow of electric current between two differently-charged objects when brought close together or when the dielectric between them breaks down, often creating a visible spark associated with the static electricity between the objects. ESD can create spectacular electric sparks (lightning ...

  8. Accelerated life testing - Wikipedia

    en.wikipedia.org/wiki/Accelerated_life_testing

    Accelerated life testing is the process of testing a product by subjecting it to conditions (stress, strain, temperatures, voltage, vibration rate, pressure etc.) in excess of its normal service parameters in an effort to uncover faults and potential modes of failure in a short amount of time. [1][2] By analyzing the product's response to such ...

  9. Environmental chamber - Wikipedia

    en.wikipedia.org/wiki/Environmental_chamber

    Example of a temperature/humidity chamber Example of a Walk-In Environmental Chamber used for automobile reliability testing in various simulated environment. An environmental chamber, also called a climatic chamber or climate chamber, is an enclosure used to test the effects of specified environmental conditions on biological items, industrial products, materials, and electronic devices and ...