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The safety benefit of reducing the power delivered to a short circuit in the load is proportional to the operating current limit. Foldback current limiting is most likely to be found in a switch-mode power supply when it is a component in a product that is independently certified to meet regional safety standards. [2] The inrush current of an ...
It is known as a current-limiting diode (CLD) or current-regulating diode (CRD). Internal structure. It consists of an n-channel JFET with the gate shorted to the source, which functions like a two-terminal current limiter (analogous to a voltage-limiting Zener diode). It allows a current through it to rise to a certain value, but not higher.
Overdrive voltage, usually abbreviated as V OV, is typically referred to in the context of MOSFET transistors.The overdrive voltage is defined as the voltage between transistor gate and source (V GS) in excess of the threshold voltage (V TH) where V TH is defined as the minimum voltage required between gate and source to turn the transistor on (allow it to conduct electricity).
In the domain of MOSFET circuits, bootstrapping is commonly used to mean pulling up the operating point of a transistor above the power supply rail. [ 2 ] [ 3 ] The same term has been used somewhat more generally for dynamically altering the operating point of an operational amplifier (by shifting both its positive and negative supply rail) in ...
In most circuits, this means pulling an enhancement-mode MOSFET's gate voltage towards its drain voltage turns it on. In a depletion-mode MOSFET, the device is normally on at zero gate–source voltage. Such devices are used as load "resistors" in logic circuits (in depletion-load NMOS logic, for example).
In digital circuits, subthreshold conduction is generally viewed as a parasitic leakage in a state that would ideally have no conduction. In micropower analog circuits , on the other hand, weak inversion is an efficient operating region, and subthreshold is a useful transistor mode around which circuit functions are designed.
The minimum subthreshold swing of a conventional device can be found by letting and/or , which yield , = (known as thermionic limit) and 60 mV/dec at room temperature (300 K). A typical experimental subthreshold swing for a scaled MOSFET at room temperature is ~70 mV/dec, slightly degraded due to short-channel MOSFET parasitics.
For Integrated circuits, the time to breakdown is dependent on the thickness of the dielectric (gate oxide) and also on the material type, which is dependent on the manufacturing process node. Older generation products with gate oxide thickness > 4nm are based on SiO2 and the advanced process nodes with gate oxide < 4nm are based on high-k ...