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  2. Automatic test switching - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_switching

    Automatic test system switching test equipment allows for high-speed testing of a device or devices in a test situation, where strict sequences and combinations of switching must be observed. By automating the process in this way, the possibility of test errors and inaccuracies is minimized, and only systematic errors would generally be ...

  3. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...

  4. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  5. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered ...

  6. Built-in self-test - Wikipedia

    en.wikipedia.org/wiki/Built-in_self-test

    Then, a periodic test will assure that the device has not become unsafe since the POST. Safety-critical devices normally define a "safety interval", a period of time too short for injury to occur. The self test of the most critical functions normally is completed at least once per safety interval. The periodic test is normally a subset of the POST.

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  9. Digital electronics - Wikipedia

    en.wikipedia.org/wiki/Digital_electronics

    Additionally, where clocked digital systems interface to analog systems or systems that are driven from a different clock, the digital system can be subject to metastability where a change to the input violates the setup time for a digital input latch. Since digital circuits are made from analog components, digital circuits calculate more ...

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