Search results
Results from the WOW.Com Content Network
A fault model, falls under one of the following assumptions: single fault assumption: only one fault occur in a circuit. if we define k possible fault types in our fault model the circuit has n signal lines, by single fault assumption, the total number of single faults is k×n. multiple fault assumption: multiple faults may occur in a circuit.
Equivalent faults produce the same faulty behavior for all input patterns. Any single fault from the set of equivalent faults can represent the whole set. In this case, much less than k×n fault tests are required for a circuit with n signal line. Removing equivalent faults from entire set of faults is called fault collapsing.
For example, the power-handling ability of a resistor may be greatly derated when applied in high-altitude aircraft to obtain adequate service life. A sudden fail-open fault can cause multiple secondary failures if it is fast and the circuit contains an inductance; this causes large voltage spikes, which may exceed 500
A special-cause failure is a failure that can be corrected by changing a component or process, whereas a common-cause failure is equivalent to noise in the system and specific actions cannot be made to prevent the failure. Harry Alpert observed: A riot occurs in a certain prison.
A fault tree diagram. Fault tree analysis (FTA) is a type of failure analysis in which an undesired state of a system is examined. This analysis method is mainly used in safety engineering and reliability engineering to understand how systems can fail, to identify the best ways to reduce risk and to determine (or get a feeling for) event rates of a safety accident or a particular system level ...
A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to ...
Accelerated life testing is the process of testing a product by subjecting it to conditions (stress, strain, temperatures, voltage, vibration rate, pressure etc.) in excess of its normal service parameters in an effort to uncover faults and potential modes of failure in a short amount of time.
Although usually the result of a fault, there are cases where short circuits are caused intentionally, for example, for the purpose of voltage-sensing crowbar circuit protectors. In circuit analysis, a short circuit is defined as a connection between two nodes that forces them to be at the same voltage. In an 'ideal' short circuit, this means ...