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Statistical parametric mapping (SPM) is a statistical technique for examining differences in brain activity recorded during functional neuroimaging experiments. It was created by Karl Friston . It may alternatively refer to software created by the Wellcome Department of Imaging Neuroscience at University College London to carry out such analyses.
Shock pulse method (SPM) is a technique for using signals from rotating rolling bearings as the basis for efficient condition monitoring of machines. From the innovation of the method in 1969 it has been further developed and broadened and is a worldwide accepted philosophy for condition monitoring of rolling bearings and machine maintenance.
Gwyddion is a multiplatform modular free software for visualization and analysis of data from scanning probe microscopy (SPM) techniques (like AFM, MFM, STM, SNOM/NSOM). [1] The project is led by its main developers David Nečas (Yeti) and Petr Klapetek who work together with several various developers across the world.
Analysis of Functional NeuroImages (AFNI) is an open-source environment for processing and displaying functional MRI data—a technique for mapping human brain activity. AFNI is an agglomeration of programs that can be used interactively or flexibly assembled for batch processing using shell script .
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.
ISAS (Ictal-Interictal SPECT Analysis by SPM) is an objective tool for analyzing ictal vs. interictal SPECT scans. The goal of ictal SPECT is to localize the region of seizure onset for epilepsy surgery planning. ISAS was introduced and validated in two recent studies (Chang et al., 2002; McNally et al., 2005).
Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe.
AFM-IR combines the chemical analysis power of infrared spectroscopy and the high-spatial resolution of scanning probe microscopy (SPM). The term was first used to denote a method that combined a tuneable free electron laser with an atomic force microscope (AFM, a type of SPM) equipped with a sharp probe that measured the local absorption of ...