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  2. Environmental stress screening - Wikipedia

    en.wikipedia.org/wiki/Environmental_stress_screening

    Environmental stress screening (ESS) refers to the process of exposing a newly manufactured or repaired product or component (typically electronic) to stresses such as thermal cycling and vibration in order to force latent defects to manifest themselves by permanent or catastrophic failure during the screening process. The surviving population ...

  3. Worst-case circuit analysis - Wikipedia

    en.wikipedia.org/wiki/Worst-case_circuit_analysis

    In addition to a circuit analysis, a WCCA often includes stress and derating analysis, failure modes and effects criticality and reliability prediction . The specific objective is to verify that the design is robust enough to provide operation which meets the system performance specification over design life under worst-case conditions and ...

  4. Highly accelerated life test - Wikipedia

    en.wikipedia.org/wiki/Highly_accelerated_life_test

    A highly accelerated life test (HALT) is a stress testing methodology for enhancing product reliability in which prototypes are stressed to a much higher degree than expected from actual use in order to identify weaknesses in the design or manufacture of the product. [1]

  5. High-temperature operating life - Wikipedia

    en.wikipedia.org/wiki/High-temperature_operating...

    High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.

  6. Temperature cycling - Wikipedia

    en.wikipedia.org/wiki/Temperature_cycling

    It is an environmental stress test used in evaluating product reliability as well as in manufacturing to catch early-term, latent defects by inducing failure through thermal fatigue. External links [ edit ]

  7. Accelerated life testing - Wikipedia

    en.wikipedia.org/wiki/Accelerated_life_testing

    Accelerated life testing is the process of testing a product by subjecting it to conditions (stress, strain, temperatures, voltage, vibration rate, pressure etc.) in excess of its normal service parameters in an effort to uncover faults and potential modes of failure in a short amount of time.

  8. List of EDA companies - Wikipedia

    en.wikipedia.org/wiki/List_of_EDA_companies

    Delta Design - software tool for electronic design automation (EDA) IC Manage: GDP Design & IP Management, Envision Design Progress Analytics, Envision Verification Analytics, High Performance Computing; Ing.-Büro FRIEDRICH: TARGET 3001! PCB Layout CAD Software Schematic editor; Simulation PSpice compliant; PCB design; Front panel design; SQL ...

  9. Hardware stress test - Wikipedia

    en.wikipedia.org/wiki/Hardware_stress_test

    A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.