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  2. Phase-contrast microscopy - Wikipedia

    en.wikipedia.org/wiki/Phase-contrast_microscopy

    In its positive form, the background light is instead phase-shifted by +90°. The background light will thus be 180° out of phase relative to the scattered light. The scattered light will then be subtracted from the background light to form an image with a darker foreground and a lighter background, as shown in the first figure. [5] [6] [7]

  3. Phase-contrast imaging - Wikipedia

    en.wikipedia.org/wiki/Phase-contrast_imaging

    In geology, phase contrast is exploited to highlight differences between mineral crystals cut to a standardised thin section (usually 30 μm) and mounted under a light microscope. Crystalline materials are capable of exhibiting double refraction , in which light rays entering a crystal are split into two beams that may exhibit different ...

  4. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...

  5. Low-energy electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Low-energy_electron_microscopy

    A low-energy electron microscope used for surface science studies at University of Illinois' Frederick Seitz Materials Research Laboratory in Urbana, IL, USA. Low-energy electron microscopy, or LEEM, is an analytical surface science technique used to image atomically clean surfaces, atom-surface interactions, and thin (crystalline) films. [1]

  6. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  7. Microscopy - Wikipedia

    en.wikipedia.org/wiki/Microscopy

    In general, these techniques make use of differences in the refractive index of cell structures. Bright-field microscopy is comparable to looking through a glass window: one sees not the glass but merely the dirt on the glass. There is a difference, as glass is a denser material, and this creates a difference in phase of the light passing through.

  8. High-resolution transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/High-resolution...

    While this term is often also used to refer to high resolution scanning transmission electron microscopy, mostly in high angle annular dark field mode, this article describes mainly the imaging of an object by recording the two-dimensional spatial wave amplitude distribution in the image plane, similar to a "classic" light microscope.

  9. Non-contact atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Non-contact_atomic_force...

    In grid spectroscopy multiple force spectra are taken in a grid over a surface, to build up a three-dimensional force map above the surface. These experiments can take a considerable time, often over 24 hours, thus the microscope is usually cooled with liquid helium or an atom tracking method is employed to correct for drift. [27]