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  2. Small-angle X-ray scattering - Wikipedia

    en.wikipedia.org/wiki/Small-angle_X-ray_scattering

    Small-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes and characteristic distances of partially ordered materials. [1]

  3. Characterization of nanoparticles - Wikipedia

    en.wikipedia.org/wiki/Characterization_of...

    Nanotoxicology is the study of the toxic effects of nanoparticles on living organisms. Characterization of a nanoparticle's physical and chemical properties is important for ensuring the reproducibility of toxicology studies, and is also vital for studying how the physical and chemical properties of nanoparticles determine their biological effects.

  4. Three-dimensional X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/Three-dimensional_X-ray...

    Three-dimensional X-ray diffraction (3DXRD) is a microscopy technique using hard X-rays (with energy in the 30-100 keV range) to investigate the internal structure of polycrystalline materials in three dimensions.

  5. Grazing incidence diffraction - Wikipedia

    en.wikipedia.org/wiki/Grazing_incidence_diffraction

    Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [ 3 ] X-ray standing waves , another X-ray variant where the intensity decay into a sample from diffraction is used to analyze chemistry.

  6. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions.

  7. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.

  8. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.

  9. Powder diffraction - Wikipedia

    en.wikipedia.org/wiki/Powder_diffraction

    This is directly related to the fact that information is lost by the collapse of the 3D space onto a 1D axis. Nevertheless, powder X-ray diffraction is a powerful and useful technique in its own right. It is mostly used to characterize and identify phases, and to refine details of an already known structure, rather than solving unknown structures.

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